Cross correlation analysis in brain electrical activity mapping

Surgery – Truss – Pad

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A61B 504

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active

048440868

ABSTRACT:
A diagnostic method is disclosed wherein brain evoked potential (EP) data from a plurality of electrode sites on the patient's head is gathered and compared with a comparable EP for normal patients by forming (1) the cross-correlation between the patient's EP and the normal EP, (2) the maximum cross-correlation for any time shift in a selected period or C.sub.max, and (3) the time shift T.sub.max at which the maximum correlation occurs. Selected ones of these values for particular evoked potentials are used to compute diagnostic feature values, and a plurality of diagnostic feature values are used to achieve a diagnosis of brain pathology.

REFERENCES:
patent: 3696808 (1972-10-01), Roy et al.
patent: 4408616 (1983-10-01), Duffy et al.
Duffy et al., "Brain Electrical Activity Mapping (BEAM): A Method for Extending the Clinical Utility of EEG and Evoked Potential Data" Ann. Neurol., 5:309-321 (1979).
Duffy et al., "Significance Probability Mapping: An Aid in the Topographic Analysis of Brain Electrical Activity", Electroencephalography and Clinical Neurophysiology, 51:455-462 (1981).
Duffy et al., "Topographical Display of Evoked Potentials: Clinical Applications of Brain Electrical Activity Mapping (BEAM)", Anals New York Academy of Sciences, 388:183-196 (1982).
Duffy et al., "Tumor Detection from Topographic Maps of Long Latentcy Evoked Potentials: Spatial Trajectory Analysis and Cross Correlation Analyses", unpublished paper.

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