Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2006-07-11
2006-07-11
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S179000, C702S182000, C702S190000
Reexamination Certificate
active
07076402
ABSTRACT:
A system for compressing a set of data points is provided. The system includes a critical aperture compression module that is configured to discard one or more data points from the set of data points. The discarded one or more data points fall within a tolerance band surrounding a straight line that represents a trend of the discarded one or more data points. A remainder of the set of data points represents a compressed set of data points.
REFERENCES:
patent: 4646241 (1987-02-01), Ratchford et al.
patent: 4669097 (1987-05-01), Bristol
patent: 6597660 (2003-07-01), Rueda et al.
patent: 6912575 (2005-06-01), Swift et al.
Fletcher Yoder
General Electric Company
Hoff Marc S.
Suarez Felix
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