Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Analysis and verification
Reexamination Certificate
2011-03-15
2011-03-15
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Design of semiconductor mask or reticle
Analysis and verification
C716S051000, C716S052000, C716S054000, C716S055000, C716S056000, C430S005000, C430S030000
Reexamination Certificate
active
07908572
ABSTRACT:
An optical proximity correction (OPC) based integrated circuit design system and method introduce a variable rule in which rules are specified in terms of multiple correction actions that yield acceptable results. This category of rules provides more degrees of freedom in actual application so that the rule-based OPC tool can intelligently select the proper valid rule that minimizes the OPC complexity or meets other objectives.
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Do Thuan
Hall Estill
Milks, III William C.
Nguyen Nha T
Takumi Technology Corporation
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