Creating and applying variable bias rules in rule-based...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Analysis and verification

Reexamination Certificate

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C716S051000, C716S052000, C716S054000, C716S055000, C716S056000, C430S005000, C430S030000

Reexamination Certificate

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07908572

ABSTRACT:
An optical proximity correction (OPC) based integrated circuit design system and method introduce a variable rule in which rules are specified in terms of multiple correction actions that yield acceptable results. This category of rules provides more degrees of freedom in actual application so that the rule-based OPC tool can intelligently select the proper valid rule that minimizes the OPC complexity or meets other objectives.

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patent: 6523162 (2003-02-01), Agrawal et al.
patent: 7024655 (2006-04-01), Cobb
patent: 7028284 (2006-04-01), Cobb et al.
patent: 2003/0061587 (2003-03-01), Zhang et al.
patent: 2003/0163791 (2003-08-01), Falbo et al.
patent: 2003/0208741 (2003-11-01), Ono
patent: 2004/0137343 (2004-07-01), Eurlings et al.
patent: 2004/0168147 (2004-08-01), Dai et al.

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