Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-10-15
2009-12-29
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07639030
ABSTRACT:
In one embodiment, a head assembly to be adapted about a solid immersion lens includes a plurality of jets configured in a radial pattern that extends from a central portion to a substantial periphery of the head assembly. The jets may expel a liquid coolant stream to cool a semiconductor device with a radial impingement pattern so that the liquid coolant travels from a central portion of the semiconductor surface to a peripheral portion of the semiconductor surface. Other embodiments are described and claimed.
REFERENCES:
patent: 6836131 (2004-12-01), Cader et al.
patent: 7102374 (2006-09-01), Cader et al.
patent: 2006/0266497 (2006-11-01), Berger et al.
patent: 2007/0290702 (2007-12-01), Lee
Campbell Shaun
Intel Corporation
Nguyen Ha Tran T
Trop Pruner & Hu P.C.
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