Crack trapping and arrest in thin film structures

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With large area flexible electrodes in press contact with...

Reexamination Certificate

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C257S689000, C257S619000, C257S620000, C257SE21476

Reexamination Certificate

active

07573130

ABSTRACT:
The present invention relates to a process for preparing a robust crack-absorbing integrated circuit chip comprising a crack trapping structure containing two metal plates and a via-bar structure sandwiched between said plates.

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