Crack stop and moisture barrier

Details Crack stop and moisture barrier Crack stop and moisture barrier

2005-03-14

2010-06-22

Williams, Alexander O (Department: 2826)

Active solid-state devices (e.g., transistors, solid-state diode

Combined with electrical contact or lead

Of specified material other than unalloyed aluminum

C257SE23002, C257SE23194, C257S686000, C257S685000, C257S698000, C257S723000, C257S724000, C257S728000, C257S618000, C257S619000, C257S620000

Reexamination Certificate

active

07741715

ABSTRACT:
A design for a crack stop and moisture barrier for a semiconductor device includes a plurality of discrete conductive features formed at the edge of an integrated circuit proximate a scribe line. The discrete conductive features may comprise a plurality of staggered lines, a plurality of horseshoe-shaped lines, or a combination of both.

REFERENCES:
patent: 5834829 (1998-11-01), Dinkel et al.
patent: 6022791 (2000-02-01), Cook et al.
patent: 6163065 (2000-12-01), Seshan et al.
patent: 6271578 (2001-08-01), Mitwalsky et al.
patent: 6365958 (2002-04-01), Ibnabdeljalil et al.
patent: 6486526 (2002-11-01), Narayan et al.
patent: 6495918 (2002-12-01), Brintzinger
patent: 6841455 (2005-01-01), West et al.
patent: 7235864 (2007-06-01), Lee
patent: 2005/0151239 (2005-07-01), Lee

Affiliated with

Also associated with

Rating

Crack stop and moisture barrier does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Crack stop and moisture barrier, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Crack stop and moisture barrier will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4247823