Crack propagation stops for dicing of planar lightwave...

Optical waveguides – Integrated optical circuit

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C385S015000, C385S129000

Reexamination Certificate

active

06895133

ABSTRACT:
One aspect of the present invention relates to a method of dicing a substrate containing a plurality of non-rectangular shaped optical integrated circuits, involving forming stop cracks in the wafer, each stop crack adjacent and substantially parallel one of the non-rectangular shaped optical integrated circuits, and cutting the substrate in a curvilinear manner substantially parallel to a stop crack. Another aspect of the present invention relates to an optical structure containing a substrate; a plurality of non-rectangular shaped optical integrated circuits on the substrate, each non-rectangular shaped optical integrated circuit having an active region; and at least one stop crack positioned adjacent each non-rectangular shaped optical integrated circuit.

REFERENCES:
patent: 4610079 (1986-09-01), Abe et al.
patent: 5447585 (1995-09-01), Dannoux et al.
patent: 5789302 (1998-08-01), Mitwalsky et al.
patent: 5872883 (1999-02-01), Ohba et al.
patent: 5926586 (1999-07-01), Dragone et al.
patent: 6219471 (2001-04-01), Doerr
patent: 6407360 (2002-06-01), Choo et al.
patent: 6495918 (2002-12-01), Brintzinger

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Crack propagation stops for dicing of planar lightwave... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Crack propagation stops for dicing of planar lightwave..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Crack propagation stops for dicing of planar lightwave... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3422017

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.