CPP sensor with in-stack biased free layer

Details CPP sensor with in-stack biased free layer CPP sensor with in-stack biased free layer

2006-07-11

2006-07-11

Castro, Angel (Department: 2653)

Dynamic magnetic information storage or retrieval

Head

Magnetoresistive reproducing head

Reexamination Certificate

active

07075760

ABSTRACT:
A magnetic head assembly includes a read head with a current perpendicular to the planes (CPP) sensor. The CPP sensor includes an AP pinned layer structure, a free layer and a spacer layer which is located between the free layer and the AP pinned layer structure. An in-stack longitudinal biasing structure for longitudinally biasing the free layer includes a pinned layer, an AFM pinning layer for pinning the pinned layer and a ruthenium spacer layer which is located between the pinned layer and the free layer. The free layer includes first and second free films with the first free film being iron and interfacing the spacer layer. The second free film may be nickel iron for imparting magnetic softness to the first free film. The pinned layer and a second AP pinned layer of the free layer structure may also be iron. The iron content of the layers in the sensor and the ruthenium spacer layer significantly increase the magnetoresistive coefficient dr/R of the CPP sensor.

REFERENCES:
patent: 6750068 (2004-06-01), Chen
patent: 6856493 (2005-02-01), Pinarbasi

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