Coupling devices for operations such as testing

Details Coupling devices for operations such as testing Coupling devices for operations such as testing

1982-06-01

1984-12-11

Levy, Stewart J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324158P, G01R 106

Patent

active

044881118

ABSTRACT:
A ring connector (80) is provided for electrically coupling device contacts such as probes (59) on a card (50) to circuit elements such as pads (94) on a performance board (90). The probes (59) are conventionally disposed outwardly of and around an axis 55 normal to card (50) whereat a device (10) being contacted is generally located. The ring connector (80) has first and second major faces, a thickness therebetween sufficient to install preferably insertable type couplers for coupling to contacts and circuit elements and an axis therethrough common to the axis 55 of the probe 59. Couplers such as sockets (84) are installed in the first face of the ring connector (80) for coupling to the probes (59) on card (50) and such sockets (84) are disposed outwardly of and around the common axis (55). Couplers such as pins (82) are installed in the second face of the ring connector (80) for coupling to circuit elements such as the pads (94) on the performance board (90). At least a first array of such pins (82) are advantageously disposed inwardly of the probe coupling sockets (84) and around the common axis (55). To acquire at least up to 140 conductive paths with a ring connector (80), a second array of couplers such as pins (82) are disposed outwardly of the probe coupling sockets (84) and around the common axis (55).

REFERENCES:
patent: 3835381 (1974-09-01), Garretson et al.
patent: 3866119 (1975-02-01), Ardezzone et al.
patent: 3963986 (1976-06-01), Morton et al.
patent: 4084869 (1978-04-01), Yen
patent: 4094568 (1978-06-01), Lee et al.
"Probe Card Model P70-I" Probe-Rite, Incorporated 3/1974.
Renz, U. "Test Probe Contact Grid Translator Board" IBM Tech. Disc. Bulletin, vol. 21, No. 8 Jan. 1979 pp. 3235-3236.
Byrnes, H. P. "Test Contactor" IBM Tech. Disc. Bulletin, vol. 18, No. 10, Mar. 1976, p. 3233.

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