Cost-function directed search method for generating tests for se

Details Cost-function directed search method for generating tests for se Cost-function directed search method for generating tests for se

1990-03-22

1993-10-26

Baker, Stephen M.

Excavating

371 23, G01R 3128

Patent

active

052572684

ABSTRACT:
A method for developing a test sequence and for testing manufactured digital circuits. Test vectors are developed based on a simulation-based, directed-search approach. Specifically, from a given test vector, a next test vector is developed by altering the given test vector and determining the utility of the altered trial vector in propagating circuit faults to the primary outputs, based on a simulation of the circuit and a preselected cost function. The vector set is created through an iterative process of altering an accepted test vestor to develop a next trial vector. The vector set is efficiently developed by employing one phase that treats the entire set of circuit faults as the target, followed by another phase that targets specific faults that have not been detected in the previous phase.

REFERENCES:
patent: 3961250 (1976-06-01), Snethen
patent: 4204633 (1980-05-01), Goel
patent: 4601032 (1986-07-01), Robinson
patent: 4692921 (1987-09-01), Dahbura et al.
Jones, E. et al., "Automatic Test Generation Methods for Large Scale Integrated Logic", IEEE Journal of Solid-State Circuits, vol. SC-2, No. 4, Dec. 1967, pp. 221-226.
Seshu, S. et al., "The Diagnosis of Asynchronous Sequential Switching Systems", IRE Trans. on Electronic Computers, vol. EC-11, Aug. 1962, pp. 459-465.
Seshu, S., "On an Improved Diagnosis Program", IEEE Trans. on Electronic Computers, vol. EC-14, Feb. 1965, pp. 76-79.
Breuer, M., "A Random and an Algorithmic Technique for Fault Detection Test Generation for Sequential Circuits", IEEE Trans. on Computers, Nov. 1971, pp. 1364-1370.
Hill, F. et al., "SCIRTSS: A Search System for Sequential Circuit Test Sequences", IEEE Trans. on Computers, May 1977, pp. 490-502.
Miczo, A., Digital Logic Testing and Simulation, copyright 1986 by Harper & Row, Publishers, Inc., pp. 28-43.
Kirkland, T. et al., "Algorithms for Automatic Test Generation", IEEE Design & Test, Jun. 1988, pp. 43-55.
Bruer, M., "New Concepts in Automated Testing of Digital Circuits", in Computer-Aided Design of Digital Electronic Circuits and Systems, Musgrave, G. ed., North-Holland Pub. Co., 1979, pp. 57-80.
Verma, J. et al., "Automatic Test-Generation and Test-Verification of Digital Systems", Proc. 11th Design Automation Workshop, 1974, pp. 149.158.
Goldstein, L., "Controllability/Observability Analysis of Digital Circuits", IEEE Trans. on Circuits and Systems, vol. CAS-26, No. 9, Sep. 1979, pp. 685-693.
"On the Acceleration of Test Generation Algorithms," IEEE Trans. Comput., Fujiwara and Shimono, C-32, pp. 1137-1144 (Dec. 1983).
"CONT: A Concurrent Test Generation Algorithm," Takamatsu and Kinoshita, Fault-Tolerant Computing Symp. (FTCS) Digest of Papers, Pittsburgh, Pa., pp. 22-27 (Jul. 1987).
"A Sequential Circuit Test Generation System," Proc. Int. Test Conf., Mallela, et al., Philadelphia, Pa., pp. 57-61 (Nov. 1985).
"An Effective Test Generation System for Sequential Circuits," Proc. Des. Auto. Conf., Marlett, Las Vegas, Nevada, pp. 250-256 (Jun. 1986).

Affiliated with

Also associated with

Rating

Cost-function directed search method for generating tests for se does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Cost-function directed search method for generating tests for se, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Cost-function directed search method for generating tests for se will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-964972