Correction method for defects in imagers

Details Correction method for defects in imagers Correction method for defects in imagers

2005-08-24

2008-12-30

Patel, Kanji (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S246000

Reexamination Certificate

active

07471820

ABSTRACT:
A method and apparatus that allows for the identification and correction of defective pixels and/or pixel clusters in an imaging device. The method, and implementing apparatus determines that a pixel is defective based upon a comparison of its pixel signal value with the value of neighboring pixels. In one exemplary embodiment, a pixel is defective if it is beyond a pre-determined threshold of either a high or low value from its neighboring, corrected pixels. Pixels identified as defective can be corrected using exemplary methods of the invention such as substituting a value of the defective pixel with a value of one of its non-defective neighbors.

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Johnathon Fewkes et.al., Enhance picture quality using advanced camera system, Micron Technology, Inc., published Apr. 18, 2005.

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