Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2002-06-14
2009-08-04
Le, Brian Q (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S103000, C382S216000, C342S022000, C250S221000, C701S096000, C714S100000
Reexamination Certificate
active
07570793
ABSTRACT:
The invention relates to a method for providing corrected data in order to generate a model of a monitoring area which is located in the respective visual range of at least two opto-electronic sensors for determining the position of detected objects, based on the amounts of raw data elements corresponding to object points in said monitoring area, said amounts of raw data elements being respectively detected by one of the sensors when the visual range is sensed and associated therewith, and the amounts of raw data elements from various sensors which are temporally linked to each other forming a group. The raw data elements corresponding to said amounts respectively comprise at least the coordinates of object points detected by the associated sensor in relation to the position of the detecting sensor. In order to form corrected amounts of corrected data elements corresponding to the amounts of raw data elements of a group for each group quantity, the coordinates contained in the raw data elements are transformed into a common coordinate system, taking into account the relative position of the respective sensors.
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Dittmer Martin
Lages Ulrich
Willhoeft Volker
Harness & Dickey & Pierce P.L.C.
IBEO Automobile Sensor GmbH
Le Brian Q
Woldemariam Aklilu K
LandOfFree
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