Corrected concentric spectrometer

Details Corrected concentric spectrometer Corrected concentric spectrometer

2000-10-27

2001-07-24

Font, Frank G. (Department: 2877)

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

C356S305000

Reexamination Certificate

active

06266140

ABSTRACT:

STATEMENT REGARDING FEDERALLY SPONSORED RESEARCH OR DEVELOPMENT
Not Applicable
BACKGROUND OF THE INVENTION
A typical spectrometer is used to provide a spectral image of a scene. The scene to be measured is imaged along an entrance slit via a conventional telescope image system or the like. Each feature of the scene is spectrally dispersed by the spectrometer so that a corresponding spectral image of the scene is produced at the receiver. The spectrometer must measure the equivalent of hundreds of spectra at the same time. Each spectra must not interfere with adjacent spectra, thus high spatial and spectral imaging resolution is required. Most commercial spectrometers are not capable of high spatial imaging resolution and low distortion because optical aberrations, such as field curvature and the like, tend to distort the spectral image of the slit. The advent of large charge coupled detector (CCD) arrays has made it possible to sample an image with over a million separate detectors (pixels). It would be desirable to have a spectrometer that can preserve the inherent CCD spatial resolution and provide optical imaging of the desired spectra that has a resolution and absence of distortion that fits the CCD array rectilinear geometry.
BRIEF SUMMARY OF THE INVENTION
A high resolution aberration corrected concentric spectrometer includes a convex diffraction grating having a plurality of nonparallel lines. The curved lines of the convex grating provide correction for field aberrations. The utilization of a convex diffraction grating enables the present spectrometer to provide highly accurate spectral imaging with greatly improved resolution. By utilizing the convex diffraction grating with the nonparallel grooves, the spectrometer is functional for a large number of applications.


REFERENCES:
patent: 5768040 (1998-06-01), Macenka et al.
patent: 5859702 (1999-01-01), Lindblom
patent: 5880834 (1999-03-01), Chrisp

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