Corneal topography slit image alignment via analysis of...

Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C351S212000, C351S213000

Reexamination Certificate

active

11186733

ABSTRACT:
A corneal topography slit image alignment system10,includes a half-slit projector14for projecting half-slit images onto a patient's eye16.Half-slit images28and30are aligned into a single slit image. A camera18captures an image of the aligned slit image. Processor20including a memory26connected to the half-slit projector12and the camera18analyzes the alignment of the half-slit images28and30.An edge detector22detects the edges of each captured half-slit image and determines an amount of misalignment of the half-slit images28and30relative to half-slit images being aligned into a single slit image. This amount of misalignment allows computer processor20to correct the three-dimensional coordinates of the slit images obtained by a slit beam system14.

REFERENCES:
patent: 5512966 (1996-04-01), Snook
patent: 5562656 (1996-10-01), Sumiya
patent: 5886767 (1999-03-01), Snook
patent: 6056404 (2000-05-01), Kawai et al.
patent: 6257723 (2001-07-01), Sarver et al.
patent: 6669684 (2003-12-01), Nakamura
patent: 2003/0189689 (2003-10-01), Rathjen
International Search Report (PCT/ISA/210) and Written Opinion (PCT/ISA/237) mailed on Dec. 5, 2006.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Corneal topography slit image alignment via analysis of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Corneal topography slit image alignment via analysis of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Corneal topography slit image alignment via analysis of... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3885538

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.