Geometrical instruments – Gauge – Movable contact probe – per se
Patent
1984-06-04
1986-02-04
Little, Willis
Geometrical instruments
Gauge
Movable contact probe, per se
G01B 728
Patent
active
045676720
ABSTRACT:
A coordinate measuring instrument in which a touch signal probe is brought into contact with a workpiece to be measured and a contour of the workpiece is measured in response to an electric signal on the basis of the aforesaid contact.
The touch signal probe used in this measuring instrument comprises a first member held on a main body of the probe and a second member rotatably provided on the first member and having a contact member. The second member has a forward end constantly positioned on the rotary axis of the second member irrespective of any position of rotation of the second member.
REFERENCES:
patent: 2665492 (1954-01-01), Freimark
patent: 3512261 (1970-05-01), Viollet
patent: 3785058 (1974-01-01), Egli
patent: 4288925 (1981-09-01), McMurtry
patent: 4451987 (1984-06-01), Cusack
patent: 4477976 (1984-10-01), Suzuki
Honda Masataka
Sakata Hideo
Little Willis
Mitutoyo Mfg. Co. Ltd.
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