Geometrical instruments – Gauge – Coordinate movable probe or machine
Patent
1985-07-10
1986-12-23
Martin, Jr., William D.
Geometrical instruments
Gauge
Coordinate movable probe or machine
33 1M, G01B 703
Patent
active
046303812
ABSTRACT:
A coordinate measuring instrument wherein a measuring element is related to a work to be measured, and a configuration or the like of the work is measured from a displacement of this measuring element. In this measuring instrument, one of supports is supported by one of guide rails in a manner to be positionally adjustable in direction of X- and Z-axes and the other of the supports is supported in a manner to be displaceable only in a direction of one of the guide rails. A slider guide rail racked across the supports can be adjusted in its posture in the direction of X- and Z-axes by a posture adjusting mechanism provided on connecting portions between the slider rail and the supports. The slider guide rail thus adjusted in posture in non-displaceable in the moving direction of a slider in a state where adjustment members provided on the slider guide rail are closely abutted against abutting surfaces of the supports.
REFERENCES:
patent: 4442607 (1984-04-01), Sakata et al.
patent: 4551919 (1985-11-01), Sakata et al.
Sakata Hideo
Tsunoda Eiichi
Martin, Jr. William D.
Mitutoyo Mfg. Co. Ltd.
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