Geometrical instruments – Gauge – With support for gauged article
Patent
1996-03-11
1998-07-14
Fulton, Christopher W.
Geometrical instruments
Gauge
With support for gauged article
33503, 33551, G01B 728, G01B 7004
Patent
active
057785511
ABSTRACT:
For roughness measurements, a passive roughness probe 118 having a probe tip 119 is exchanged into the measuring probe head of the coordinate measuring apparatus in lieu of the probe pin having a probe ball which is otherwise used to make coordinate measurements. The generation of the measurement points takes place while using the already available measured value transducers 23 in the probe head of the coordinate measuring apparatus. The desired surface characteristic variables are computed from the stored quasi-analog measured point sequence with the aid of a corresponding software module.
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Arndt Thomas
Herklotz Henrik
Ohnheiser Rainer
Schepperle Karl
Carl-Zeiss-Stiftung
Fulton Christopher W.
Ottesen Walter
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