Data processing: measuring – calibrating – or testing – Measurement system – Dimensional determination
Reexamination Certificate
2007-03-20
2007-03-20
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Dimensional determination
C702S127000
Reexamination Certificate
active
11065153
ABSTRACT:
A method for measuring a workpiece includes the steps: measuring measurement points on the surface of a workpiece using a measuring device; evaluating the measured measurement points in such a manner that a predetermined desired geometry of the workpiece to be measured and an actual geometry defined by the measured measurement points are mapped one on top of the other with the aid of a fitting method. In order to be able to adapt or fit the predetermined desired geometry of the workpiece to a measured workpiece, which had been altered, the application of a fitting method is suggested. In this method, transformation parameters are additionally provided for the fitting. These parameters permit a defined transformation of the desired geometry or of the actual geometry with regard to a targeted change of shape of the desired geometry or of the actual geometry.
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patent: 2002/0077769 (2002-06-01), Ebinger
patent: WO 00/06969 (2000-02-01), None
Chen, J; Chen, Y; “Estimation of Coordinate Machine Error Parameters”; IEEE International Conference on Robotics and Automation; vol. 4; Mar. 1987; pp. 196-201.
“Global and Local Deformations of Solid Primitives”, by A. Barr, Computer Graphics, vol. 18, No. 3, Jul. 1984, pp. 21 to 30.
Görsch Daniel
Lotze Andreas
Barlow John
Carl Zeiss Industrielle Messtechnik GmbH
Ottesen Walter
Washburn Douglas N.
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