Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
Patent
1997-12-18
1999-10-12
Barlow, John
Data processing: measuring, calibrating, or testing
Measurement system
Orientation or position
702168, 702167, 702 95, 702 41, 36447429, 36447437, 33503, 33504, 33505, G01B 5012, G05B 1919
Patent
active
059666811
ABSTRACT:
The invention is directed to a method which is provided for controlling coordinate measuring apparatus wherein a probe head (2) is moved and has a movably attached probe unit (24) attached thereto. The probe unit (24) is charged with a measurement force Fmeas relative to the probe head (2). The measurement force Fmeas operates against the mass inertial forces Fzp which occur because of acceleration of the probe. The measurement force Fmeas is comprised of a desired measurement force Fdes and a corrective measurement force Fcorr. The desired measurement force Fdes is constant in magnitude and is directed perpendicularly to the surface of the workpiece (15) to be measured. The corrective measurement force Fcorr at least partially compensates for the mass inertial forces (Ftr, Fzp) which occur because of the acceleration of the probe unit (24).
REFERENCES:
patent: 5471406 (1995-11-01), Breyer et al.
patent: 5594668 (1997-01-01), Bernhardt et al.
patent: 5610846 (1997-03-01), Trapet et al.
patent: 5623766 (1997-04-01), Ruck et al.
Bernhardt Ralf
Grupp Gunter
Ruck Otto
Barlow John
Carl-Zeiss-Stiftung
Ottesen Walter
Vo Hien
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