Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1998-03-24
1999-03-09
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356305, G01J 318
Patent
active
058808345
ABSTRACT:
A 1:1 Offner mirror system for imaging off-axis objects is modified by replacing a concave spherical primary mirror that is concentric with a convex secondary mirror with two concave spherical mirrors M1 and M2 of the same or different radii positioned with their respective distances d1 and d2 from a concentric convex spherical diffraction grating having its grooves parallel to the entrance slit of the spectrometer which replaces the convex secondary mirror. By adjusting their distances d1 and d2 and their respective angles of reflection .alpha. and .beta., defined as the respective angles between their incident and reflected rays, all aberrations are corrected without the need to increase the spectrometer size for a given entrance slit size to reduce astigmatism, thus allowing the imaging spectrometer volume to be less for a given application than would be possible with conventional imaging spectrometers and still give excellent spatial and spectral imaging of the slit image spectra over the focal plane.
REFERENCES:
Max Born et al., Principles of Optics, "Electromagnetic Theory of Propagation Interference and Diffraction of Light," Pergamon Press, 1965, pp. 412-415.
Evans F. L.
Kusmiss John H.
The United States of America as represented by the Administrator
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