Measuring and testing – Volume or rate of flow – Thermal type
Patent
1980-05-05
1982-03-30
Myracle, Jerry W.
Measuring and testing
Volume or rate of flow
Thermal type
338 22SD, G01F 168
Patent
active
043218253
ABSTRACT:
A silicon temperature sensitive resistive element for employment as a convective cooling rate sensor. The convective cooling rate sensor comprises a small chip of silicon having an impurity ion cncentration level high enough to assure that the sensor exhibits an extrinsic positive temperature coefficient of resistance throughout a desired temperature range. The silicon chip is connected to a pair of metal electrodes. These metal electrodes have a cross-sectional area providing a desired rate of conductive cooling through these electrodes. A predetermined amount of electrical power is applied to the convective cooling rate sensor via the electrodes to cause ohmic self-heating of the sensor. The temperature of the sensor is determined by measuring the resistance of the sensor. The rate of temperature change is indicative of the rate of convective cooling of the sensor by the medium surrounding the sensor. This convective cooling rate sensor can be employed to determine which of two fluids of differing thermal conductivity surround the sensor or to determine the flow rate of a fluid of known thermal conductivity past the sensor.
REFERENCES:
patent: 3412610 (1968-11-01), Prussin
patent: 3995481 (1976-12-01), Djorup
Davis Paul H.
Rehn Larry A.
Tarpley Roy W.
Heiting Leo N.
Marshall, Jr. Robert D.
Myracle Jerry W.
Sharp Melvin
Texas Instruments Incorporated
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