Controlling time delay

Coded data generation or conversion – Analog to or from digital conversion – Digital to analog conversion

Reexamination Certificate

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Details

C341S120000

Reexamination Certificate

active

06531974

ABSTRACT:

BACKGROUND
This invention relates to controlling time delay.
Time delays (also called skew) occur, for example, in the propagation of clock signals to different parts of a synchronous computer system, impacting the ability to maintain synchronicity. With higher processor speeds (shorter clock cycles), the relative effect of skew increases.
One way to maintain synchronicity uses a phase locked loop (PLL) that has an internal clock in the form of a voltage controlled oscillator (VCO). A PLL receives an input signal (e.g., a reference clock signal that embodies the system clock period (T)), synchronizes the PLL's internal clock with the input signal's phase and frequency, and delivers an output clock signal equal to a multiple of the input signal. The PLL may accomplish this synchronicity by controlling a voltage bias to the VCO including a delay line.
As shown in
FIG. 1
, a delay line
10
may include differential current starved delay stages
12
a-k,
where k is a number that is large enough to guarantee that the delay through the delay line
10
can be adjusted to a percentage of T, e.g., 2T and T/5, in spite of the effects of any manufacturing process variations, operating temperatures, supply conditions, and range of operating clock periods. The desired time delay may be adjusted to a multiple of T in a number of ways, e.g., by changing the value of k, by dynamically adjusting the current/voltage driving the delay line
10
during circuit operation as described below, or by manufacturing calibration or trim techniques. These adjustment techniques all require using large-range control structures to cover large variability in necessary delay time.
A current digital-to-analog-converter (IDAC)
14
may drive the current/voltage used by the delay stages
12
a-k
at a node
18
. The current/voltage on the control line
18
is inversely proportional to T and to the time delay across each delay stage
12
a-k.
The IDAC
14
can provide many coarse current steps so that the delay line
10
can be adjusted to the desired delay value as described above. The IDAC
14
also can provide many fine current steps to compensate for the linear relationship between digital inputs
16
a-n
and the current/voltage at the node
18
.
FIG. 2
shows another IDAC
11
. The IDAC
11
includes m digital inputs
13
, each digital input corresponding to a transistor
15
a-m
and a switch
17
a-m.


REFERENCES:
patent: 5283631 (1994-02-01), Koerner et al.
patent: 5389828 (1995-02-01), Tago
patent: 5680075 (1997-10-01), Sacca
patent: 5900754 (1999-05-01), Nakatani
patent: 6294944 (2001-09-01), Shiochi et al.

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