Controlling ion populations in a mass analyzer

Radiant energy – Ionic separation or analysis – Methods

Reexamination Certificate

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C250S286000, C250S288000, C250S290000

Reexamination Certificate

active

06987261

ABSTRACT:
Method and apparatus of controlling an ion population to be analyzed in a mass analyzer. Ions are accumulated for an injection time interval determined as a function of an ion accumulation rate and a predetermined desired population of ions. The accumulation rate represents a flow rate of ions from a source of ions into an ion accumulator. Ions derived from the accumulated ions are introduced into the mass analyzer for analysis.

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patent: 6331702 (2001-12-01), Krutchinsky et al.
patent: 2004/0245455 (2004-12-01), Reinhold
patent: 2353632 (2001-02-01), None
A. N. Krutchinsky, et al., “Collisional Damping Interface for an Electrospray Ionization Time-of-Flight Mass Spectrometer”,J. American Society for Mass Spectrometry, 9:569-579 (1998).
Jean H. Futrell, “Development of tandem mass spectrometry: one perspective,”International Journal of Mass Spectrometry, 200:495-508 (2000).

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