Excavating
Patent
1995-08-24
1998-04-21
Beausoliel, Jr., Robert W.
Excavating
371 2232, G01R 3128
Patent
active
057426171
ABSTRACT:
A test access port controller is provided for implementing scan testing with a chain of scan latches on an integrated circuit. The test access port controller can implement a structural test or a performance test. Selection between the two types of test is achieved through logic circuitry of the test access port controller. An integrated circuit and a test system are also provided.
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Beausoliel, Jr. Robert W.
Iqbal Nadeem
Morris James H.
SGS-Thomson Microelectronics Limited
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