Controlled impedance microcircuit probe

Details Controlled impedance microcircuit probe Controlled impedance microcircuit probe

1987-02-24

1988-04-26

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, 324 73PC, 324158F, G01R 106, G01R 3102

Patent

active

047407468

ABSTRACT:
A probe for coupling electrical test equipment to a selected point of an electrical device has a resiliently supported rigid pin for contacting the selected point and a wave guide of substantially constant characteristic impedance coupling the test equipment to the pin.

REFERENCES:
patent: 4116523 (1978-09-01), Coberly et al.
patent: 4355857 (1982-10-01), Hayward
patent: 4383217 (1983-05-01), Shiell
patent: 4593243 (1986-06-01), Lao et al.
patent: 4636722 (1987-01-01), Ardezzone
"Tester Contact Method", by Kappel et al., IBM Tech. Disc. Bull., 2/79, vol. 21, #9, p. 3742.
"Gigahertz Probl. Assembly", by Beers, IBM Tech. Disc. Bull., 9/72, vol. 15, #4, p. 1144.
"A Coaxial Test Probe", by Abbatecola et al., IBM Tech. Disc. Bull., 12/69, vol 12, #7, p. 1061.
"Probe for MOS Measurements", by Hoepstra, IBM Tech. Disc. Bull., 3/71, vol. 13, #10, p. 2981.
"Probe Head for Tester", Zak et al., Aug. 1971, IBM Tech. Discl. Bull., vol 14, #3, p. 756.
"High Performance Contactor", Bove, Feb. 1976, IBM Tech. Disc. Bull., vol. 18, #9, p. 2883.

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