Controllable and testable oscillator apparatus for an...

Oscillators – Ring oscillators

Reexamination Certificate

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Details

C331S10800D, C331S074000, C331S034000

Reexamination Certificate

active

06888414

ABSTRACT:
An integrated circuit (IC) includes an internal clock generator apparatus that provides various modes of operation of the integrated circuit. The internal clock generator apparatus includes a clock generator portion that is operable to provide a clock signal for various circuitry/logic of the integrated circuit and a control portion that is operable to receive a control signal to cause the integrated circuit to operate in one of several modes. In particular, the clock generator apparatus is responsive to the control signal, preferably from an external source, to bypass the clock signal, introduce a test clock signal for digital testing, and isolate and/or measure a delay through the clock generator portion of the clock generator apparatus.

REFERENCES:
patent: 4517532 (1985-05-01), Neidorff
patent: 5126691 (1992-06-01), Mijuskovic et al.
patent: 5355097 (1994-10-01), Scott et al.
patent: 5517109 (1996-05-01), Albean et al.
patent: 5737342 (1998-04-01), Ziperovich
patent: 5815043 (1998-09-01), Chow et al.
patent: 6380782 (2002-04-01), Buck
patent: 6397342 (2002-05-01), Terauchi
patent: 19905499 (1999-08-01), None
patent: 19830571 (2000-01-01), None

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