Control system for a failure mode testing system

Details Control system for a failure mode testing system Control system for a failure mode testing system

2006-04-04

2006-04-04

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C073S663000

Reexamination Certificate

active

07024323

ABSTRACT:
A control system for a failure mode testing system is described. The control system employs at least one control algorithm that enables the testing system to be operated at optimal pressure and frequency levels in order to generate a desired system response, such as a desired energy level and desired slope of the fast Fourier transform of the system response. Also described are a pressure dither system and a frequency ringing system for enhancing the operation of the actuator cylinders of the failure mode testing system. All three of the systems can be incorporated, either singularly or in combination, into a computer software program that can be employed to operate and control the failure mode testing system.

REFERENCES:
patent: 2850893 (1958-09-01), Barnes, Jr.
patent: 3592041 (1971-07-01), Spencer
patent: 3597960 (1971-08-01), Otera et al.
patent: 3628378 (1971-12-01), Regan, Jr.
patent: 3646807 (1972-03-01), Gray et al.
patent: 3664181 (1972-05-01), Conrad et al.
patent: 3712125 (1973-01-01), Meyer
patent: 3732380 (1973-05-01), Kimball
patent: 3942362 (1976-03-01), Keller
patent: 4069706 (1978-01-01), Marshall et al.
patent: 4112776 (1978-09-01), Ouellette et al.
patent: 4181026 (1980-01-01), Abstein et al.
patent: 4181027 (1980-01-01), Talbott, Jr.
patent: 4181028 (1980-01-01), Talbott, Jr.
patent: 4232558 (1980-11-01), Jon et al.
patent: 4263809 (1981-04-01), Petersen et al.
patent: 4428238 (1984-01-01), Tauscher
patent: 4445381 (1984-05-01), Russenberger
patent: 4489612 (1984-12-01), Griggs
patent: 4537077 (1985-08-01), Clark et al.
patent: 4635764 (1987-01-01), Woyski et al.
patent: 4641050 (1987-02-01), Emerson et al.
patent: 4658656 (1987-04-01), Haeg
patent: 4700148 (1987-10-01), Pauly
patent: 4715229 (1987-12-01), Butts
patent: 4733151 (1988-03-01), Butts
patent: 4735089 (1988-04-01), Baker et al.
patent: 4802365 (1989-02-01), Sallberg et al.
patent: 4862737 (1989-09-01), Langer
patent: 4869111 (1989-09-01), Ohya et al.
patent: 4912980 (1990-04-01), Baughn
patent: 4970725 (1990-11-01), McEnroe et al.
patent: 4977342 (1990-12-01), Adams
patent: 4996881 (1991-03-01), Tauscher et al.
patent: 5038617 (1991-08-01), Rollet et al.
patent: 5079955 (1992-01-01), Eberhardt
patent: 5138884 (1992-08-01), Bonavia
patent: 5154567 (1992-10-01), Baker, deceased et al.
patent: 5156051 (1992-10-01), Marshall
patent: 5197333 (1993-03-01), Garcia-Gardea
patent: 5305645 (1994-04-01), Reifsnider et al.
patent: 5315882 (1994-05-01), Meyer et al.
patent: 5339677 (1994-08-01), Haug
patent: 5339697 (1994-08-01), Mullin
patent: 5343752 (1994-09-01), Woyski et al.
patent: 5351545 (1994-10-01), Lucas
patent: 5353654 (1994-10-01), Lin
patent: 5365788 (1994-11-01), Hobbs
patent: 5375453 (1994-12-01), Rudd et al.
patent: 5379645 (1995-01-01), Smart
patent: 5386728 (1995-02-01), Norton et al.
patent: 5425276 (1995-06-01), Gram et al.
patent: 5431491 (1995-07-01), Melgaard et al.
patent: 5437191 (1995-08-01), Dripke et al.
patent: 5476009 (1995-12-01), Dimarogonas
patent: 5487301 (1996-01-01), Muller et al.
patent: 5517857 (1996-05-01), Hobbs
patent: 5540109 (1996-07-01), Hobbs
patent: 5544478 (1996-08-01), Shu et al.
patent: 5544528 (1996-08-01), Woyski et al.
patent: 5553501 (1996-09-01), Gaddis et al.
patent: 5565618 (1996-10-01), Hu
patent: 5574226 (1996-11-01), Reuther et al.
patent: 5589637 (1996-12-01), Hobbs
patent: 5594177 (1997-01-01), Hanse
patent: 5610334 (1997-03-01), Fima et al.
patent: 5641912 (1997-06-01), Manahan, Sr.
patent: 5652386 (1997-07-01), Dimarogonas
patent: 5665919 (1997-09-01), Woyski et al.
patent: 5675098 (1997-10-01), Hobbs
patent: 5700951 (1997-12-01), Sagiyama et al.
patent: 5715180 (1998-02-01), Hu
patent: 5744724 (1998-04-01), Hobbs
patent: 5752834 (1998-05-01), Ling
patent: 5813541 (1998-09-01), Mottram
patent: 5836202 (1998-11-01), Hobbs
patent: 5979242 (1999-11-01), Hobbs
patent: 6023985 (2000-02-01), Fournier
patent: 6035715 (2000-03-01), Porter
patent: 6697746 (2004-02-01), Porter et al.
Beasley,Keith, “New Standards For Old”, Quality and Reliability Engineering International, vol. 6, pp. 289-294 (1990).
Blanks, Henry S., “Arrhenius And The Temperature Dependence Of Non-Constant Failure Rate”, Quality and Reliability Engineering International, vol. 6, pp. 259-265 (1990).
Blemel, Kenneth G., “Virtual HALT and HASS Planning for Stress Testing From Architecture Selection Through Design”, 1996 Proceedings—Accelerated Reliability Technology Symposium—Denver, Colorado, Sep. 16-20, 1996, pp. 1-6.
Cooper, Michael R., “Statistical/Numerical Methods for Stress Screen Development”, 1996 Proceedings—Accelerated Reliability Technology Symposium—Denver, Colorado, Sep. 16-20, 1996, pp. 1-37.
Coppola, Anthony, “A Better Method for Verifying Production Reliability”, Quality and Reliability Engineering International, vol. 6, pp. 295-299 (1990).
Edison, Larry, “Combining Team Spirit and Statistical Tools With the H.A.L.T. Process”, 1996 Proceedings—Accelerated Reliability Technology Symposium—Denver, Colorado, Sep. 16-20, 1996, pp. 1-8.
Ganter, William A., “Increasing Importance of Effects of Marginal Parts On Reliability”, Quality and Reliability Engineering International, vol. 6, pp. 285-288 (1990).
Granlund, Kevin, “A Method of Reliability Improvement Using Accelerated Testing Methodologies”, 1996 Proceedings—Accelerated Reliability Technology Symposium—Denver, Colorado, Sep. 16-20, 1996, pp. 1-9.
Haibel, Chet., “Design Defect Tracking”, 1996 Proceedings—Accelerated Reliability Technology Symposium—Denver, Colorado, Sep. 16-20, 1996, pp. 1-12.
Hakim, Edward B., “Microelectronic Reliability/Temperature Independence”, Quality and Reliability Engineering International, 1991, vol. 7, pp. 215-220.
Hobbs, Gregg, “What HALT and HASS Can Do For Your Product”, EE-Evaluation Engineering, Nov. 1997, pp. 138-142.
Hobbs, Gregg, “Reliability—Past and Present”, 1996 Proceedings—Accelerated Reliability Technology Symposium—Denver, Colorado, Sep. 16-20, 1996, pp. 1-5.
Lambert, Ronald G., “Case Histories of Selection Criteria For Random Vibration Screening”, Journal of Environmental Sciences, Jan./Feb. 1985, pp. 19-25.
Leonard, Charles T., et al., “How Failure Prediction Methodology Affects Electronic Equipment Design”, Quality and Reliability Engineering International, vol. 6, pp. 243-249 (1990).
McLinn, James A., “Constant Failure Rate—A Paradigm in Transition?”, Quality and Reliability Engineering International, vol. 6, pp. 237-241 (1990).
Minor, Edward O., “Accelerated Quality Maturity for Avionics”, 1996 Proceedings Accelerated Reliability Technology Symposium—Denver, Colorado, Sep. 16-20, 1996, pp. 1-18.
Morelli, Mark L., & Masotti, Robert V., “History of Accelerate Reliability Testing at Otis Elevator Company”, 1996 Proceedings—Accelerated Reliability Technology Sympsoium—Denver, Colorado, Sep. 16-20, 1996, pp. 1-8.
Moss, Dick, “The Myth of Burn-in”, 1996 Proceedings—Accelerated Reliability Technology Symposium—Denver, Colorado, Sep. 16-20, 1996, pp. 1-4.
O'Connor, Patrick D.T., “Achieving World Class Quality & Reliability: Science or Art?”, 1996 Proceedings—Accelerated Reliability Technology Symposium—Denver, Colorado, Sep. 16-20, 1996, pp. 1-4.
Pecht, Michael, et al., “Temperature Dependence of Microelectronic Device Failures”, Quality and Reliability Engineering International, vol. 6, pp. 275-284 (1990).
Pecht, Michael, et al., “The Reliability Physics Approach To Failure Prediction Modeling”, Quality and Reliability Engineering International, vol. 6, pp. 267-273 (1990).
Smithson, Stephen A., “Effectiveness and Economics”, Proceedings of the IES, 1990, pp. 737-742.
Stewart, Ph.D., P.E., Bret A., “Fault Coverage and Dia

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