Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Patent
1984-11-26
1985-10-29
Pianalto, Bernard D.
Coating processes
Measuring, testing, or indicating
Thickness or uniformity of thickness determined
427 38, 427 85, 427 87, 427 93, 427250, 4272552, 427294, B05D 306
Patent
active
045500312
ABSTRACT:
A method of modulation doping GaAs, (Al,Ga)As and related compounds with silicon ions during molecular beam epitaxy (MBE) growth.
Dahle Omund R.
Honeywell Inc.
Pianalto Bernard D.
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