Control method of an automatic integrated circuit full...

Details Control method of an automatic integrated circuit full... Control method of an automatic integrated circuit full...

2005-03-29

2005-03-29

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S121000, C714S033000, C714S043000

Reexamination Certificate

active

06873927

ABSTRACT:
A control method for an automatic integrated circuit full testing system. A control device is utilized to control the testing process of the automatic integrated circuit full testing system. The steps for controlling the control device include driving an automatic transport device to fetch test integrated circuits from an integrated circuit supply rack to various testing computer stations. An automatic plug/unplug tool is driven so that each integrated circuit is plugged into the connector of a corresponding testing computer. All the testing computers are triggered to carry out respective preset testing programs. An image sensor is driven to monitor the an output image of the testing computers so that any abnormality in the integrated circuits can be determined. Thereafter, the automatic plug/unplug tool is driven to unload the tested integrated circuit from the testing computer. The automatic transport device is driven to transfer the tested integrated circuit to various integrated circuit bins of an integrated circuit binning device according to the testing results.

REFERENCES:
patent: 5865319 (1999-02-01), Okuda et al.
patent: 6442712 (2002-08-01), Jeon

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