X-ray or gamma ray systems or devices – Source support – Including object support or positioning
Reexamination Certificate
2011-01-25
2011-01-25
Kiknadze, Irakli (Department: 2882)
X-ray or gamma ray systems or devices
Source support
Including object support or positioning
C378S197000
Reexamination Certificate
active
07874727
ABSTRACT:
According to the invention, an X-ray examination may be simply and rapidly carried out and hence produce a sharp X-ray image with an X-ray source and/or X-ray receiver an X-ray examination system which may be displaced relative to the mounting position thereof by means of an actuator, despite a system construction which may be caused to oscillate at a resonant frequency dependent on the corresponding mounting position, about the mounting position, whereby according to the inventive method, at least one parameter relevant to the resonant frequency, dependent on the corresponding mounting position, is determined, a set guided movement, counteracting the cause of oscillation in order to achieve a movement condition for the X-ray source or X-ray receiver necessary for the X-ray examination, is determined depending on the at least one corresponding parameter and the guided movement of the X-ray source and/or X-ray receiver controlled using the actuator according to the set guided movement.
REFERENCES:
patent: 4798006 (1989-01-01), Barnaby
patent: 4872190 (1989-10-01), Stojkov et al.
patent: 6580245 (2003-06-01), Zander et al.
patent: 6825633 (2004-11-01), Hamann et al.
patent: 102 00 680 (2004-03-01), None
patent: 2003 190140 (2003-07-01), None
International Search Report dated Aug. 22, 2006.
Written Opinion dated Aug. 2006.
Meckl et al., “Minimizing Residual Vibration for Point-to-Point Motion,”Journal of Vibration and Accoustics, American Society of Mechanical Engineers, vol. 107, No. 4, Oct. 1985, pp. 378-328.
Forster Gerhard
Hamann Jens
Ladra Uwe
Schäfers Elmar
Schliermann Claus-Günter
Brinks Hofer Gilson & Lione
Kiknadze Irakli
Siemens Aktiengesellschaft
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