Optics: measuring and testing – Of light reflection
Patent
1994-11-25
1996-05-21
McGraw, Vincent P.
Optics: measuring and testing
Of light reflection
356446, G01N 2147, G01N 2155
Patent
active
055194974
ABSTRACT:
An infrared densitometer which measures the diffuse component of reflectivity as marking particles are progressively deposited on a moving photoconductive belt. Collimated light rays are projected onto a test patch including the marking particles. The light rays reflected from the test patch are collected and directed onto a photodiode array. The photodiode array generates electrical signals proportional to the total flux and a diffuse component of the total flux of the reflected light rays. Circuitry compares the electrical signals and determines the difference to generate an electrical signal proportional to the specular component of the total flux of the reflected light rays. Additional circuitry adds the electrical signals proportional to the total flux and the diffuse component of the total flux of the reflected light rays and compares the result of the summed signal to the specular component to provide a total diffuse signal for controlling developed mass.
REFERENCES:
patent: 4950905 (1990-08-01), Butler et al.
patent: 4989985 (1991-02-01), Hubble, III et al.
patent: 5078497 (1992-01-01), Borton et al.
patent: 5083161 (1992-01-01), Borton et al.
patent: 5119132 (1992-06-01), Butler
Borton Michael D.
Hubble, III Fred F.
Martin James P.
Shoemaker Ralph A.
Chapuran Ronald F.
McGraw Vincent P.
Xerox Corporation
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