Contour-sensitive, single-field deinterlacing method

Details Contour-sensitive, single-field deinterlacing method Contour-sensitive, single-field deinterlacing method

1995-01-06

1997-02-11

Coles, Sr., Edward L.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

358428, 348448, 382266, H04N 140, H04N 701, G06K 940

Patent

active

056026544

ABSTRACT:
The present invention is a two-step, contour-sensitive deinterlacing technique. The first step of the technique determines for each missing pixel of an interlaced frame of image pixels whether the absolute difference between the pixels above and below the missing pixel is greater than a preselected threshold value. If it is decided that the missing pixel lies at a low-vertical frequency location, its value is estimated via vertical interpolation. Otherwise, the second step is carried out. The goal of the second step is to determine whether or not there is a well-defined contour passing through the missing pixel, and to determine its direction if there is one. In the presence of a well-defined contour, the missing pixel is obtained by averaging the intensity values along the direction of the contour in the field lines immediately above and below the missing field line. Otherwise the process effectively falls back to vertical interpolation. The presence of a well-defined contour is detected by comparing the summed absolute differences (SAD) of blocks of pixels along a predetermined set of candidate directions, including the vertical direction, and selecting the direction associated with the least SAD. The fall-back to vertical interpolation in the absence of a well-defined contour is implicit due to the weighting of the SAD corresponding to the vertical direction.

REFERENCES:
patent: 4472732 (1984-09-01), Bennett et al.
patent: 5019903 (1991-05-01), Dougall et al.
patent: 5303060 (1994-04-01), Iwamura
patent: 5305112 (1994-04-01), Yamamoto et al.
patent: 5382976 (1995-01-01), Hibbard
patent: 5473383 (1995-12-01), Sezan et al.

Affiliated with

Also associated with

Rating

Contour-sensitive, single-field deinterlacing method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Contour-sensitive, single-field deinterlacing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contour-sensitive, single-field deinterlacing method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-346449