Contour replicating and measuring device

Details Contour replicating and measuring device Contour replicating and measuring device

1998-04-22

2000-09-26

Hoff, Marc S.

Data processing: measuring, calibrating, or testing

Measurement system

Dimensional determination

702168, 425 4R, G01B 520

Patent

active

061253383

ABSTRACT:
A surface replicating and contour measuring device substantially comprises a mechanical pin array having calibration pins mounted on a frame, an imaging system for recording contour and a data processor for storing and manipulating the recorded information.

REFERENCES:
patent: 4766500 (1988-08-01), Yaniv et al.
patent: 4890235 (1989-12-01), Reger et al.
patent: 4972351 (1990-11-01), Reger et al.
patent: 4998354 (1991-03-01), Silverman et al.
patent: 5243971 (1993-09-01), Sullivan et al.
patent: 5281117 (1994-01-01), Hong
patent: 5470590 (1995-11-01), Brubaker et al.
patent: 5540223 (1996-07-01), Starr et al.
patent: 5647357 (1997-07-01), Barnett et al.
patent: 5655527 (1997-08-01), Scarberry et al.

Affiliated with

Also associated with

Rating

Contour replicating and measuring device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Contour replicating and measuring device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contour replicating and measuring device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2108264