Geometrical instruments – Gauge – Having a movable contact probe
Reexamination Certificate
2007-12-28
2010-06-01
Smith, R. A. (Department: 2841)
Geometrical instruments
Gauge
Having a movable contact probe
C033S503000
Reexamination Certificate
active
07726036
ABSTRACT:
An exemplary contour measuring probe includes a guide (12), a movable rack, a counter-balancing mechanism, a linear measuring scale (24), and a displacement sensor (26). The movable rack comprises a tip extension (20) for touching a surface of an object. The tip extension (20) is pushed to move towards the object under a gravitational force acting on the movable rack. The counter-balancing mechanism is configured to partially counter balance the gravitational force acting on the movable rack. The linear measuring scale (24) displays values of displacements of the tip extension (20). The displacement sensor (26) detects and reads the displacement values displayed by the linear measuring scale (24).
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Li Jun-Qi
Liu Qing
Nakagawa Takeo
Hon Hai Precision Industry Co. Ltd.
Hong Fu Jin Precision Industry ( ShenZhen) Co., Ltd.
Niranjan Frank R.
Smith R. A.
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