Contour measuring probe

Details Contour measuring probe Contour measuring probe

2011-03-29

2011-03-29

Bennett, G. Bradley (Department: 2841)

Geometrical instruments

Gauge

Movable contact probe, per se

C033S551000

Reexamination Certificate

active

07913412

ABSTRACT:
A contour measuring probe includes an air guide, a sliding member and a probe tip. The air guide defines a guide hole. The sliding member is slidably received in the guide hole. The probe tip is fixed on an end of the sliding member. A cross-section of the sliding member is non-circular, and the guide hole is a non-circular hole, such that the sliding member slides only along an axis of the air guide.

REFERENCES:
patent: 7065893 (2006-06-01), Kassai et al.
patent: 7398603 (2008-07-01), Liu et al.
patent: 7594338 (2009-09-01), Kong et al.
patent: 7650701 (2010-01-01), Liu et al.
patent: 7681323 (2010-03-01), Liu et al.
patent: 2005/0229419 (2005-10-01), Dall'Aglio et al.
patent: 2009/0007449 (2009-01-01), Liu et al.
patent: 2009/0094849 (2009-04-01), Kong et al.
patent: 2010/0101105 (2010-04-01), Hon et al.

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