Contour measuring method for measuring aspects of objects

Details Contour measuring method for measuring aspects of objects Contour measuring method for measuring aspects of objects

2007-12-28

2010-02-02

Bennett, G. Bradley (Department: 2841)

Geometrical instruments

Gauge

With support for gauged article

C033S503000

Reexamination Certificate

active

07654008

ABSTRACT:
An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a contour measuring probe (10) comprising a tip extension (16), a displacement sensor (19), and a processor (119) connected to the displacement sensor, the tip extension being slidable in a first direction; (2) driving the tip extension to move so as to contact with the object at a first predetermined point, and recording a coordinate of the first predetermined point in the processor; (3) driving one of the tip extension and the object to move, thus, the tip extension contacting with the object at a second predetermined point, the displacement sensor sensing a displacement of the tip extension along the first direction and sending the displacement to the processor, and the processor recording a coordinate of the second predetermined point; and (4) repeating the step (3), the processor recording a series of measured coordinates of points.

REFERENCES:
patent: 5207005 (1993-05-01), Amos et al.
patent: 5426861 (1995-06-01), Shelton
patent: 6453730 (2002-09-01), Takemura
patent: 6758085 (2004-07-01), Nagaike et al.
patent: 7398603 (2008-07-01), Liu et al.
patent: 7513027 (2009-04-01), Boehm et al.
patent: 2004/0088874 (2004-05-01), Sohn et al.
patent: 2006/0037208 (2006-02-01), McMurtry

Affiliated with

Also associated with

Rating

Contour measuring method for measuring aspects of objects does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Contour measuring method for measuring aspects of objects, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contour measuring method for measuring aspects of objects will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4202456