Contour measuring device with error correcting unit

Details Contour measuring device with error correcting unit Contour measuring device with error correcting unit

2007-08-23

2009-02-17

Bennett, G. Bradley (Department: 2841)

Geometrical instruments

Gauge

With support for gauged article

C033S0010MP, C033S546000

Reexamination Certificate

active

07490413

ABSTRACT:
An exemplary contour measuring device (100) includes a pair of guide rails (13), a movable fixture (14), a first probe (15), a second probe (16), and an error correcting unit (17). The movable fixture is movably disposed on the guide rails. The first probe is configured for measuring an object along a contour measuring direction and obtaining a first measured contour value from the object to be measured. The second probe is configured for measuring a standard object whose contour is known along the contour measuring direction and obtaining a second measured contour value from the standard object. The error correcting unit is configured for compensating the first measured contour value according to the second measured contour value.

REFERENCES:
patent: 1856944 (1932-05-01), Blomstrom
patent: 2880516 (1959-04-01), Tandler
patent: 4122608 (1978-10-01), Hopf
patent: 5333386 (1994-08-01), Breyer et al.
patent: 5426861 (1995-06-01), Shelton
patent: 5485406 (1996-01-01), Wada et al.
patent: 2006/0037208 (2006-02-01), McMurtry
patent: 2007/0051004 (2007-03-01), Liu

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