Contour measuring apparatus

Geometrical instruments – Area integrators – Electrical

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

33174L, 33149J, G01B 728

Patent

active

042650224

ABSTRACT:
A measuring device for measuring the contour of an object is disclosed. The device comprises a measuring arm having a first center of gravity adjacent at one end thereof, a second center of gravity adjacent the other end thereof and a fulcrum thereinbetween. The arm is configured such that the first and second centers of gravity and the fulcrum lie in a common line.

REFERENCES:
patent: 3319341 (1967-05-01), Graham
patent: 3785056 (1974-01-01), Schiler
patent: 4074438 (1978-02-01), Takeda
patent: 4141148 (1979-02-01), Noguchi

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Contour measuring apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Contour measuring apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contour measuring apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-290720

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.