Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2005-07-19
2005-07-19
Au, Amelia M. (Department: 2623)
Image analysis
Pattern recognition
Feature extraction
C382S203000
Reexamination Certificate
active
06920248
ABSTRACT:
A contour detecting apparatus for accurately detecting a contour of a target object without increasing the detection time is disclosed. The apparatus comprises a section for storing a contour model consisting of nodes, which surrounds at least one target object in a captured image and is used for detecting a contour of the target object; a deforming section for contracting or expanding the contour model by shifting the nodes based on a predetermined rule; a section for calculating a distance between two non-adjacent nodes of the contour model which was deformed by the deforming section, and determining that the contour model is to be split when the calculated distance is equal to or smaller than a predetermined threshold; and a section for splitting the contour model according to a result of the above determination, wherein the splitting operation is executed in the vicinity of said non-adjacent nodes.
REFERENCES:
patent: 5881170 (1999-03-01), Araki et al.
patent: 6636635 (2003-10-01), Matsugu
patent: 8-189809 (1996-07-01), None
patent: 8-329254 (1996-12-01), None
Au Amelia M.
Tucker Wesley
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