Continuously profiled probe beam

Details Continuously profiled probe beam Continuously profiled probe beam

2005-09-27

2005-09-27

Davis, Antoine D. (Department: 2913)

Measuring, testing, or signalling instruments

Measuring, regulating or indicating instrument, or casing

Electrical property

Design Patent

active

D0510043

CLAIM:
The ornamental design for a continuously profiled probe beam, as shown and described.

REFERENCES:
patent: 6515496 (2003-02-01), Felici et al.
patent: 6530148 (2003-03-01), Kister

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