Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Reexamination Certificate
2005-08-09
2005-08-09
Hindenburg, Max F. (Department: 3737)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
Reexamination Certificate
active
06926408
ABSTRACT:
A means to generate a continuous two-dimensional reflection pattern suitable for corneal topography that uses sinusoidal profiles of both intensity and color values. The technique provides a more robust image processing due to the ability to apply digital band pass filters, continuous data for improved surface reconstruction, and the ability to directly measure the meridian of the reflection pattern source point when the corneal surface normal does not lie in the meridian of the measurement instrument.
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patent: 4995716 (1991-02-01), Warnicki et al.
patent: 5841511 (1998-11-01), D'Souza et al.
patent: 5912723 (1999-06-01), Maddess
Hindenburg Max F.
McHale & Slavin PA
Sanders John R
Sarver & Associates Inc.
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