Continuous sloped phase edge architecture fabrication...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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Reexamination Certificate

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10808063

ABSTRACT:
A phase shift mask may include boundaries between phase shift regions with continuous sloped phase edges. The continuous sloped phase edges may be produced by introducing a predetermined degree of defocus into a beam used during production of the mask to image the pattern on the mask. Such a phase shift mask may be “trimless”, i.e., not require a corresponding binary “trim” mask for a second exposure to remove phase conflicts after exposure with the phase shift mask.

REFERENCES:
patent: 5300377 (1994-04-01), Keum
patent: 6228745 (2001-05-01), Wheeler et al.
patent: 6436590 (2002-08-01), Wang et al.
patent: 6534225 (2003-03-01), Flanders et al.
patent: 6780568 (2004-08-01), Nistler et al.
Wang et al., “Polarized Phase Shift Mask: Concept, Design, and Potential Advantages to Photolithography Process and Physical Design”, Proceedings of the SPIE; The International Society for Optical Engineering Conference; vol. 4562, pp. 406-417, 2002.
Pfau et al., “Gradient Phase-Shifter Transitions Fabricated by Ion Milling”, SPIE, vol. 1674 Optical/Laser Microlithography V, pp. 585-593, 1992.

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