Continuous metal interconnects

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

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Details

C257S683000

Reexamination Certificate

active

09672375

ABSTRACT:
A method of forming an interconnection that includes introducing a barrier material in a via of a dielectric to a circuit device on a substrate in such a manner to deposit the barrier material on the circuit device, introducing a seed material into the via in manner that leaves the barrier material overlying the circuit device substantially exposed, substantially removing the barrier material overlying the circuit device, and introducing a conductive material into the via to form the interconnection.

REFERENCES:
patent: 3705060 (1972-12-01), Stork
patent: 3784440 (1974-01-01), Grunwald et al.
patent: 4016050 (1977-04-01), Lesh et al.
patent: 4960732 (1990-10-01), Dixit et al.
patent: 4996584 (1991-02-01), Young et al.
patent: 5008216 (1991-04-01), Huang et al.
patent: 5151168 (1992-09-01), Gilton et al.
patent: 5275973 (1994-01-01), Gelatos
patent: 5290608 (1994-03-01), Grunwald et al.
patent: 5316974 (1994-05-01), Crank
patent: 5354712 (1994-10-01), Ho et al.
patent: 5371041 (1994-12-01), Liou et al.
patent: 5436504 (1995-07-01), Chakravorty et al.
patent: 5500559 (1996-03-01), Miyata et al.
patent: 5527739 (1996-06-01), Parrillo et al.
patent: 5595937 (1997-01-01), Mikagi
patent: 5674787 (1997-10-01), Zhao et al.
patent: 5695810 (1997-12-01), Dubin et al.
patent: 5714418 (1998-02-01), Bai et al.
patent: 5744376 (1998-04-01), Chan et al.
patent: 5770517 (1998-06-01), Gardner et al.
patent: 5770519 (1998-06-01), Klein et al.
patent: 5904565 (1999-05-01), Nguyen et al.
patent: 6150723 (2000-11-01), Harper et al.
patent: 6277249 (2001-08-01), Gopalraja et al.
patent: 6323131 (2001-11-01), Obeng et al.
patent: 6362089 (2002-03-01), Molla et al.
patent: 2002/0024139 (2002-02-01), Chan et al.

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