Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-10-19
2008-12-23
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S701000, C324S1540PB
Reexamination Certificate
active
07468611
ABSTRACT:
A system performs continuous full linear scan of a flat media. The system includes, in part, a chuck, and at least first, second and third gantries. The chuck is adapted to support the flat media during the test. The first gantry includes at least one linear array of non-contacting sensors that spans the width of the flat media and is adapted to move across an entire length of the flat media. Each of the second and third gantries includes a probe head that spans the width of the flat media and each is adapted to apply an electrical signal to the flat media. Each probe head is further adapted to move along a direction substantially perpendicular to the surface of the flat media during the times when the first gantry is in motion and while test signals are being continuously applied.
REFERENCES:
patent: 4870357 (1989-09-01), Young et al.
patent: 5717780 (1998-02-01), Mitsumune et al.
patent: 2004/0100299 (2004-05-01), Murakawa et al.
patent: 2592958 (1987-07-01), None
patent: 59027379 (1984-02-01), None
Aochi Steve
Baldwin David
Barnett Robert
Gangakhedkar Kaushal
Nguyen Kent
Patel Paresh
Photon Dynamics, Inc.
Townsend and Townsend / and Crew LLP
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