Continuous contour polishing of a multi-material surface

Abrading – Abrading process – Utilizing fluent abradant

Reexamination Certificate

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Reexamination Certificate

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10869605

ABSTRACT:
A chemical-mechanical polishing pad, and method of polishing a substrate using a polishing pad, comprising (a) a resilient subpad, and (b) a polymeric polishing film substantially coextensive with the resilient subpad, wherein the polymeric polishing film comprises (i) a polishing surface that is substantially free of bound abrasive particles, and (ii) a back surface releasably associated with the resilient subpad.

REFERENCES:
patent: 4167304 (1979-09-01), Gelbke
patent: 4184859 (1980-01-01), Maklad
patent: 4330171 (1982-05-01), Malsot et al.
patent: 4474429 (1984-10-01), Yoldas et al.
patent: 4493720 (1985-01-01), Gauthier et al.
patent: 4510005 (1985-04-01), Nijman
patent: 4603940 (1986-08-01), Shaw et al.
patent: 4738055 (1988-04-01), Jackson et al.
patent: 4762416 (1988-08-01), Lefevre et al.
patent: 4818263 (1989-04-01), Mitch
patent: 4831784 (1989-05-01), Takahashi
patent: 4839993 (1989-06-01), Masuko et al.
patent: 4905415 (1990-03-01), Moulin
patent: 4983251 (1991-01-01), Haisma et al.
patent: 4984865 (1991-01-01), Lee et al.
patent: 4999955 (1991-03-01), Saito et al.
patent: 5007209 (1991-04-01), Saito et al.
patent: 5082378 (1992-01-01), Muller et al.
patent: 5106394 (1992-04-01), Bramson
patent: 5107627 (1992-04-01), Mock, Jr. et al.
patent: 5117473 (1992-05-01), Pan
patent: 5136818 (1992-08-01), Bramson
patent: 5155791 (1992-10-01), Hsiung
patent: 5184433 (1993-02-01), Maack
patent: 5185966 (1993-02-01), Mock, Jr. et al.
patent: 5216843 (1993-06-01), Breivogel et al.
patent: 5257478 (1993-11-01), Hyde et al.
patent: 5265381 (1993-11-01), Takahashi
patent: 5321917 (1994-06-01), Franklin et al.
patent: 5394254 (1995-02-01), Cheng
patent: 5447464 (1995-09-01), Franklin et al.
patent: 5458531 (1995-10-01), Matsuoka et al.
patent: 5463709 (1995-10-01), Terao et al.
patent: 5464361 (1995-11-01), Suzuki et al.
patent: 5465314 (1995-11-01), Jie et al.
patent: 5479549 (1995-12-01), Kurata
patent: 5480344 (1996-01-01), Xu et al.
patent: 5481632 (1996-01-01), Hirai et al.
patent: 5482525 (1996-01-01), Kajioka et al.
patent: 5486725 (1996-01-01), Keizer et al.
patent: 5503590 (1996-04-01), Saitoh et al.
patent: 5516328 (1996-05-01), Kawada
patent: 5526452 (1996-06-01), Dannoux et al.
patent: 5547417 (1996-08-01), Breivogel et al.
patent: 5556323 (1996-09-01), Luther et al.
patent: 5566262 (1996-10-01), Yamane et al.
patent: 5577149 (1996-11-01), Averbeck et al.
patent: 5582534 (1996-12-01), Shendon et al.
patent: 5601474 (1997-02-01), Takahashi
patent: 5611943 (1997-03-01), Cadien et al.
patent: 5623567 (1997-04-01), Barberio et al.
patent: 5643053 (1997-07-01), Shendon
patent: 5650039 (1997-07-01), Talieh
patent: 5657404 (1997-08-01), Buchanan et al.
patent: 5667426 (1997-09-01), Minami et al.
patent: 5668902 (1997-09-01), Kurata
patent: 5678751 (1997-10-01), Buchanan et al.
patent: 5683290 (1997-11-01), Kanda et al.
patent: 5719978 (1998-02-01), Kakii et al.
patent: 5743785 (1998-04-01), Lundberg et al.
patent: 5743787 (1998-04-01), Ishiyama et al.
patent: 5764833 (1998-06-01), Kakii et al.
patent: 5785784 (1998-07-01), Chesley et al.
patent: 5810964 (1998-09-01), Shiraishi et al.
patent: 5823859 (1998-10-01), Erdogan et al.
patent: 5833520 (1998-11-01), Kanda et al.
patent: 5836941 (1998-11-01), Yoshihara et al.
patent: 5838448 (1998-11-01), Aiyer et al.
patent: 5855503 (1999-01-01), Csipkes et al.
patent: 5863449 (1999-01-01), Grabbe
patent: 5876269 (1999-03-01), Torii
patent: 5909530 (1999-06-01), Ohkubo et al.
patent: 5919607 (1999-07-01), Lawandy
patent: 5938504 (1999-08-01), Talieh
patent: 5958794 (1999-09-01), Bruxvoort et al.
patent: 5966485 (1999-10-01), Luther et al.
patent: 5966490 (1999-10-01), Minns et al.
patent: 5989111 (1999-11-01), Lamphere et al.
patent: 6010538 (2000-01-01), Sun et al.
patent: 6022309 (2000-02-01), Celliers et al.
patent: 6038359 (2000-03-01), Moslehi et al.
patent: 6059638 (2000-05-01), Crevasse et al.
patent: 6083083 (2000-07-01), Nishimura
patent: 6106368 (2000-08-01), Childers et al.
patent: 6113469 (2000-09-01), Yoshikawa et al.
patent: 6137938 (2000-10-01), Korn et al.
patent: 6179690 (2001-01-01), Talieh
patent: 6187515 (2001-02-01), Tran et al.
patent: 6206759 (2001-03-01), Agarwal et al.
patent: 6244935 (2001-06-01), Birang et al.
patent: 6261958 (2001-07-01), Crevasse et al.
patent: 6278816 (2001-08-01), Keur et al.
patent: 6280099 (2001-08-01), Wu
patent: 6297159 (2001-10-01), Paton
patent: 6298192 (2001-10-01), Yoo et al.
patent: 6300151 (2001-10-01), Yoon et al.
patent: 6302763 (2001-10-01), Buzzetti
patent: 6302767 (2001-10-01), Tietz
patent: 6304688 (2001-10-01), Korn et al.
patent: 6309278 (2001-10-01), Suzuki et al.
patent: 6354915 (2002-03-01), James et al.
patent: 6362107 (2002-03-01), Shiro et al.
patent: 6488575 (2002-12-01), Agarwal et al.
patent: 6498101 (2002-12-01), Wang
patent: 6503134 (2003-01-01), Shendon
patent: 6537144 (2003-03-01), Tsai et al.
patent: 6561873 (2003-05-01), Tsai et al.
patent: 6602380 (2003-08-01), Doan et al.
patent: 6612917 (2003-09-01), Bruxvoort
patent: 6746311 (2004-06-01), Kessel
patent: 6908366 (2005-06-01), Gagliardi
patent: 2001/0012427 (2001-08-01), Hyzin et al.
patent: 2001/0036341 (2001-11-01), Ohtsuka et al.
patent: 2001/0046355 (2001-11-01), Schmatz
patent: 2001/0049258 (2001-12-01), Erdogan et al.
patent: 2001/0051028 (2001-12-01), Gutierrez et al.
patent: 2003/0209448 (2003-11-01), Hu et al.
patent: 2003/0220053 (2003-11-01), Manens et al.
patent: 62-173159 (1987-07-01), None
patent: 03-081708 (1991-04-01), None
patent: WO 99/33615 (1999-07-01), None
patent: WO 01/53042 (2001-07-01), None
patent: WO 02/24409 (2002-03-01), None

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