Contaminant scanning system

Details Contaminant scanning system Contaminant scanning system

2004-01-07

2009-02-10

Raevis, Robert R (Department: 2856)

Measuring and testing

Sampler, sample handling, etc.

Capture device

Reexamination Certificate

active

07487689

ABSTRACT:
A vapor collection system. The system includes one or more walls that define a chamber for receiving inspected items, at least one pipe adapted to eject a gas jet within the chamber, the gas jet being provided at an angle relative to a normal to the wall of the chamber, at the point at which the pipe enters the chamber, at least one tube adapted to remove gas samples from the chamber, and an analysis unit adapted to determine whether the gas samples include one or more particulates.

REFERENCES:
patent: 2329055 (1943-09-01), Kegan
patent: 2832545 (1958-04-01), Benjamin
patent: 3736792 (1973-06-01), Poulsen
patent: 3741820 (1973-06-01), Hebel et al.
patent: 3942357 (1976-03-01), Jenkins
patent: 3985017 (1976-10-01), Goldsmith
patent: 3998101 (1976-12-01), Bradshaw et al.
patent: 4381673 (1983-05-01), Klauba et al.
patent: 4422334 (1983-12-01), Yasuda
patent: 4483261 (1984-11-01), Green et al.
patent: 4580440 (1986-04-01), Reid et al.
patent: 4718268 (1988-01-01), Reid et al.
patent: 4820920 (1989-04-01), Bather
patent: 4838877 (1989-06-01), Massau
patent: 4877433 (1989-10-01), Oshitari
patent: 4896547 (1990-01-01), Arney et al.
patent: 4909089 (1990-03-01), Achter et al.
patent: 4909090 (1990-03-01), McGown et al.
patent: 4987767 (1991-01-01), Corrigan et al.
patent: 5092218 (1992-03-01), Fine et al.
patent: 5092220 (1992-03-01), Rounbehler
patent: 5109691 (1992-05-01), Corrigan et al.
patent: 5123274 (1992-06-01), Carroll et al.
patent: 5162652 (1992-11-01), Cohen et al.
patent: 5202023 (1993-04-01), Trimmer et al.
patent: 5345809 (1994-09-01), Corrigan et al.
patent: 5642393 (1997-06-01), Krug et al.
patent: 5939647 (1999-08-01), Chinn et al.
patent: 5942699 (1999-08-01), Ornath et al.
patent: 6073499 (2000-06-01), Settles
patent: 6074608 (2000-06-01), Matz
patent: 6324927 (2001-12-01), Ornath et al.
patent: 6328647 (2001-12-01), Traudt
patent: 6334365 (2002-01-01), Linker et al.
patent: 6408701 (2002-06-01), Fujita
patent: 6905711 (2005-06-01), Tullo et al.
patent: 7100461 (2006-09-01), Bradley et al.
patent: 2002/0124664 (2002-09-01), Call et al.
patent: 2002/0164088 (2002-11-01), Collins
patent: 2003/0136179 (2003-07-01), Felice et al.
patent: 2003/0136203 (2003-07-01), Yoon
patent: 2004/0020267 (2004-02-01), Megerle
patent: 2004/0202574 (2004-10-01), Sapir et al.
patent: 2005/0181520 (2005-08-01), Omath
patent: 1 439 706 (1976-06-01), None
patent: WO 97/14033 (1997-04-01), None
patent: WO 03/087777 (2003-10-01), None
patent: WO 2007/007212 (2007-01-01), None
Otani, Y. et al.; “Removal of Fine Particles From Smooth Flat Surfaces by Consecutive Pulse Air Jets;” Aerosol Science Technology; vol. 23; 1995; pp. 665-673.
Otani, Y. et al.; “Removal of Fine Particles From Wafer Surface by Pulse Air Jets;” Kagaku Kogaku Ronbunshu; (1993) 19; pp. 114-119.
Masuda, H. et al.; “The Removal of Particles From Flat Surfaces Using a High-Speed Air Jet;”, Advanced Powder Technology; vol. 5; No. 2; 1994; pp. 205-217.
Gotoh, K. et al.; “High-Efficiency Removal of Fine Particles Deposited on a Solid Surface;” J. Soc Powder Tech Jpn; vol. 31; No. 10; 1994; pp. 726-733.
Liu, B. Y. H. et al.; “Development of Particle Standards for Testing Explosive Detection Systems: Characterization of the Adhesion Forces Between Composition 4 Particles and Polyethylene;” SPIE Cargo Inspection Technologies; vol. 2276; 1994; pp. 45-55.

Affiliated with

Also associated with

Rating

Contaminant scanning system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Contaminant scanning system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Contaminant scanning system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4075259