Contaminant particle identification and compensation with...

Details Contaminant particle identification and compensation with... Contaminant particle identification and compensation with...

2005-09-01

2008-09-09

Haskins, Twyler L. (Department: 2625)

Facsimile and static presentation processing

Natural color facsimile

Measuring, testing, and calibrating

C358S406000, C382S272000, C382S275000, C382S270000

Reexamination Certificate

active

07423789

ABSTRACT:
Methods of identifying the location and dimensions of a contaminant particle on a calibration strip comprise imaging a calibration strip comprising a plurality of channels and a plurality of pixel columns. The method also includes generating a normalized local average pixel intensity value and locating a contaminant particle in a pixel column by comparing the intensity of an individual pixel in the pixel column to the normalized local average pixel intensity value. An intensity value of an individual pixel less than a predefined limit set below the normalized local average pixel intensity value corresponds to a location of a contaminant particle. The method further includes identifying the number of adjacent pixels in a pixel column less than a predefined limit set below the normalized local average pixel intensity value.

REFERENCES:
patent: 4605970 (1986-08-01), Hawkins
patent: 5963661 (1999-10-01), Kato et al.
patent: 6442497 (2002-08-01), Houston et al.
patent: 6618173 (2003-09-01), Nobel et al.
patent: 6822766 (2004-11-01), Hill et al.

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