Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent
1998-11-09
2000-02-15
Kim, Robert H.
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
3562401, 356428, G01N 2100, G01N 2190
Patent
active
060259094
ABSTRACT:
Apparatus for inspecting the sealing surface area of a container finish that includes a structured light source positioned to direct a collimated line-shaped light beam onto the sealing surface area of a container as the container is moved relative to the light source. The line-shaped light beam at the container sealing surface area has a long dimension orthogonal to the container axis that extends chordally across the sealing surface area, and a narrow dimension tangential to the container axis. A light sensor is disposed to receive portions of the line-shaped light beam reflected from the sealing surface area, and provides an electrical output signal that varies with height or level of the sealing surface with respect to the light source and sensor. The sensor is coupled to associated electronics for providing information indicative of sealing surface height. The elongated dimension of the line-shaped light beam at the container sealing surface area accommodates wobble or misalignment at the sealing surface with respect to the light source and sensor. Furthermore, the elongated radial dimension of the line-shaped light beam at the container sealing surface area produces a reflection on the sensor from any wire-edge or over-press within the container mouth, thus producing at the sensor information indicative of both existence and height of any such wire-edge or over-press.
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Juvinall John W.
Ringlien James A.
Shepherd William T.
Kim Robert H.
Merlino Amanda
Owens-Brockway Glass Container Inc.
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