Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-10-10
2006-10-10
Wu, Jingge (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C250S22300B
Reexamination Certificate
active
07120284
ABSTRACT:
An L.E.D. matrix light source illuminates a bottle at an inspection machine. A vertically periodic intensity pattern is defined to facilitate the identification of defects. The L.E.D. that locates the top of the bottle is identified and a peak of the pattern is located at that L.E.D.
REFERENCES:
patent: 5496996 (1996-03-01), Barnes et al.
patent: 5536935 (1996-07-01), Klotzsch et al.
patent: 6172748 (2001-01-01), Sones et al.
patent: 6175107 (2001-01-01), Juvinall
patent: 6324253 (2001-11-01), Yuyama et al.
patent: 6452156 (2002-09-01), Lindner
patent: 6618495 (2003-09-01), Furnas
patent: 6654116 (2003-11-01), Kwirandt
patent: 6859270 (2005-02-01), Werzinger et al.
patent: 2001/0054680 (2001-12-01), Lindner
patent: 2003/0035103 (2003-02-01), Werzinger et al.
patent: 0280933 (1988-09-01), None
patent: 2002-052187 (2002-02-01), None
Emhart Glass S.A.
Le Brian
Smith Spencer T.
LandOfFree
Container inspection machine does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Container inspection machine, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Container inspection machine will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3699908