Contactor for testing integrated circuit chips mounted in molded

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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Details

324 725, 324158P, G01R 102, G01R 104

Patent

active

051774364

ABSTRACT:
A contactor including a test fixture for receiving an integrated circuit chip mounted in a carrier package and for providing contacts with electrical conductor pads of the package to facilitate electrical testing thereof is provided. The test fixture comprises a plurality of contact members mounted to a spring-loaded plunger. Each contact member includes a strip of conductive fingers with protruding contacts for springing engagement with the conductor pads of the carrier when the plunger is depressed. The test fixture resides in a cavity of a housing unit and is aligned with a central aperture therein. In operation, a ram holding the carrier lowers it through the central aperture of the housing unit and onto the plunger. The carrier is then pressed against the plunger, causing it to depress. This allows the carrier conductor pads to frictionally engage the protruding contacts of the conductive fingers, thus effectuating electrical contact.

REFERENCES:
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patent: 4498047 (1985-02-01), Hexomer et al.
patent: 4675599 (1987-06-01), Jensen et al.
patent: 4739257 (1988-04-01), Jenson et al.
patent: 4747784 (1988-05-01), Cedrone
patent: 4866374 (1989-09-01), Cedrone
patent: 4887969 (1989-12-01), Abe
patent: 4970460 (1990-11-01), Jensen et al.
patent: 4986760 (1991-01-01), Petersen et al.

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